Lab Equipment Facilities

Atomic Force Microscope and/or Magnetic Force Microscope

Lab Name: 
Laboratory for Magnetism and magnetic materials
Incharge Email: 
sbedanta@niser.ac.in
Specification: 
  • Model: Nano-Observer AFM from Concept Scientific Instrument, France.
  • Modes: Contact and Non-contact modes.
  • Magnetic Field: in-plane magnetic field upto 0.15 T can be applied.
  • Scan Area: ~ 100 µm × 100 µm
  • Resolution: depends on the probe radius.
  • Operating Temperature: Room Temperature.
Photo: 
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